Magnetism and Electron Magnetic Resonance

Electron Paramagnetic Resonance (EPR) spectroscopy makes it possible to study paramagnetic species such as free radicals, certain metal ions, or defects in materials. This technique is based on the interaction between a magnetic field and the electron spins present in the sample. It therefore provides information about the electronic structure and the local environment of the species under study. EPR is widely used in the fields of chemistry, materials science, environmental science, and life sciences.
The platform is equipped with four multifrequency EPR spectrometers covering the X to J bands, allowing the exploration of a wide range of systems and experimental conditions.

The PPMS (Physical Property Measurement System) is an instrument dedicated to measuring the physical properties of materials. It enables the study of magnetic, electrical, and thermal properties as a function of temperature and magnetic field. This equipment provides a highly controlled experimental environment for the characterization of advanced materials used in energy, electronics, and nanotechnology.
The platform is equipped with a PPMS featuring a 9-Tesla superconducting magnet, enabling detailed investigation of the physical properties of numerous functional materials.

For any analysis request, please send an email to the following address:  pole-magnetisme-rpe_at_univ-lille.fr

 

Location:
LASIRE - C4 Building - Cité scientifique
59655 Villeneuve d'Ascq

 

Staff: 

  • Karima Ben Tayeb-Meziane (Scientificn Head of the cluster)
  • Ambre Theron (Technical Head: RPE et PPMS)

 

CW Spectrometer – Elexsys E500

X-band continuous-wave (CW) mode (9 GHz)

 

Magnetic field                           0.3 Tesla
Temperatures 300K-100K (liquid nitrogen)

300K-673K and 400-1200K
Coupling * Electrochemistry

* In-situ photocalysis

* Catalysis in operando
cavities Standard, TMS (HQ, LQ), SHQE-W1 (ER4122)
High temperature (ER4114HT)

 

 

 

Standard X-Band Cavity (ER 4102ST)

This cavity operates in TE102 mode at a central frequency of 9.8 GHz with a quality factor (Q) of 6000. Optical access is provided through a 10 × 23 mm window with a 50% transmission factor. The resonator is equipped with additional coils for rapid field scanning.

 

Imaging Spectrometer – Elexsys E580

X-band continuous-wave / pulsed mode (9 GHz)

Magnetic field     0.3 Tesla
Temperatures 300K-100K (liquid nitrogen), 300K-673K
Coupling * Electrochemistry

* Photochemistry
Cavities Standard
CW Imaging 2-axis YZ gradients, 200 G/cm
Double resonance ELDOR

 

 

Pulsed Spectrometer – Elexsys E580

X-band (9 GHz) and Q-band (34 GHz) in continuous-wave/pulsed mode and pulsed imaging

Magnetic Field                          0 - 1.2 Tesla
Temperatures 5K-300K with Cryofree helium gas system
Coupling * Photochemistry
Cavities * Standards : X-band (MD5, MD4, MS3)
* Q-band (ER 5106QT-2w)
* ENDOR/ELDOR
Double resonance * X-band ENDOR
* ELDOR in X- and Q-bands
* AWG (Arbitrary Wave Generator)

 

 

PPMS DynaCool 9T

As part of the CPER ARCHI-CM project, the Michel-Eugène Chevreul Institute acquired a cryogen-free PPMS (Physical Property Measurement System). This instrument is designed to perform physical property measurements under a magnetic field of 0 to 9 T over a temperature range from 2 K to 400 K (up to 1000 K with certain options).

The PPMS, manufactured by Quantum Design, is equipped with a 9 T superconducting magnet. Cooling of the magnet to a constant temperature of 4.2 K, as well as the sample down to 1.8 K, is achieved without handling any cryogenic fluids. The liquid helium required is produced by a closed-cycle cryogenic compression system, using only gaseous helium.

The PPMS is intended for the study of solid materials and thin films with magnetic, electrical, thermal, and other properties, through various measurement options available on site.

 

The VSM (Vibrating Sample Magnetometer) option measures magnetization and magnetic susceptibility as a function of magnetic field and/or temperature. These measurements provide information on the nature and strength of magnetic couplings, magnetic ordering temperatures, and spin dynamics.

Specifications :

  • Static magnetic field (VSM): Measurement from -9 T to 9 T, over a temperature range of 1.8 K to 400 K or 300 K to 1000 K (VSM Oven).
  • Alternating magnetic field (ACMS): Measurement in an AC magnetic field up to 17 Oe, over a temperature range of 1.8 K to 400 K.

The specific heat is measured using the thermal relaxation method of the sample, with or without an applied magnetic field. These measurements are essential for detecting magnetic, structural, or electronic transitions.

Specifications :

  • Temperature range: 1.8 K – 400 K 
  • Magnetic  field: up to 9 T
  • Chamber pressure: high vacuum
  • Resolution: 10 nJ/K at 2 K

The thermal transport option allows measurement of a sample’s thermal properties, including thermal conductivity, the Seebeck effect, and electrical resistivity. These three measurements enable the determination of the thermoelectric properties of the material.

Specifications :

  • Temparture range : 1.8 K - 390 K
  • Chamber pressure: high vacuum
  • Measurement range: 10 nΩ - 5 GΩ

The electrical transport option allows various types of measurements on a sample, including resistance, magnetoresistance, differential resistance, and the Hall effect. Simultaneous analysis of two samples is possible, with measurements performed using 2- or 4-probe configurations (the 4-probe method eliminates contact resistance). The applied current frequency is adjustable, allowing approaches close to DC conditions. This enables characterization of insulating, semiconducting, and metallic behaviors in densified powders, single crystals, and thin films.

Specifications :

  • Current range: 10 nA – 100 mA
  • Frequency range: 0.1 Hz – 200 Hz
  • Measurement range: 10 nΩ – 5 GΩ

The LCR option allows measurement of a sample’s dielectric properties using an LCR meter as a function of temperature, magnetic field, and frequency.

Specifications :

  • Temperature range: 10 K – 300 K
  • Chamber pressure: high vacuum
  • Frequency range: 20 Hz – 2 MHz

The ferroelectric option allows measurement of the ferroelectric properties of a multiferroic sample using a RADIANT ferroelectric tester, as a function of temperature, magnetic field, and applied electric field.

Specifications :

  • Temperature range: 10 K – 300 K
  • Chamber pressure: high vacuum
  • Measurement range: 1 V – 10 kV